惠普/安捷倫
Hewlett Packard 3577B is a high-performance, yet economical, two-channel, (optional three-channel) network analyzer for use in both research and development and manufacturing. It is used to measure magnitude/phase, insertion loss, group delay, SWR, electrical length, and gain compression from 5 Hz to 200 MHz. When used with the 35676A/B reflection/transmission kit, it can also measure return loss, reflection coefficient, and impedance.
With the optional HP Instrument BASIC, the 3577B can execute user-written programs designed to automate measurement systems, compute parameters (such as pass band ripple and 3 dB bandwidth) or customize the user-interface. This includes system control of other HP-IB instruments and peripherals via the HP-IB. A programmable I/O port, located on the rear panel, extends the HP Instrument BASIC control to non-HP-IB devices, such as device handlers, environmental chambers, and even the device-under-test itself.
Of course, the 3577B is fully programmable, either internally with HP Instrument BASIC, or externally via the Hewlett-Packard Interface Bus (HP-IB).
An optional high-stability frequency reference oven is available for those users not having an in-house frequency standard. HP also offers a wide range of accessories, including S-parameter and reflection/transmission test sets, as well as signal injection devices for feedback control systems such as power supplies and servo loops.
Unprecedented Measurement Precision
This network analyzer has the accuracy and resolution required to characterize the most demanding narrowband devices and the flexibility to quickly characterize wideband devices. Dynamic magnitude and phase accuracy are 0.02 dB and 0.2 degree, respectively. Device response can be examined in fine detail with 0.001 dB, 0.005 degree, and 1 ps resolution. A built-in synthesized LO and tracking generator provide superb frequency accuracy with 0.001 Hz resolution. The 100 dB plus dynamic range and -130 dBm noise floor meet the needs of the most demanding measurements.
Built-in three-term error correction removes errors due to directivity, frequency response, and source mismatch for one-port measurements. Similarly, vector normalization enhances the accuracy of two-port measurements.
High-Throughput for Manufacturing
The 3577B brings high-throughput network analysis to manufacturing without compromising accuracy. Take advantage of features such as discrete sweep, comparison to limit lines, and PASS/FAIL testing to speed your manufacturing test of crystals, filters, and other devices.
